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?B 6
File 6:NTIS 64-92/9203B1
(COPR. 1992 NTIS)
Set Items Description
--- ----- -----------
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S1 12970 TECH/TI
S2 21629 NOTE/TI
S3 12666 TECH/TI(W)NOTE/TI
S4 12671 NTISNTND/ID
S5 12673 TECH()NOTE/TI
OR NTISNTND/ID
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?SS S5 AND LASER/TI,DE*
12673 S5
S6 8112 LASER/TI,DE*
S7 53 S19
AND LASER/TI,DE*
?SS S7/1990:1992
53
S7
S8 84014 PY=1990 : PY=1992
S9 9
S7/1990:1992
?T 9/TI/ALL À§ÀÇ S9 ¹øÀ» title ¸¸ 9°Ç ¸ðµÎ Ãâ·ÂÇÏ´Â ¸í·É
9/TI/1
Radiative Processes in Air Excited by an ArF Laser: Studies
are directed
toward the use of fluorescence to measure temperature
(NTIS Tech Note)
9/TI/2
Processing Laser-Velocimetric Data by Vector Scanning: Velocity
plots can
now be obtained in minutes instead of hours
(NTIS Tech Note)
9/TI/3
Laser-Assisted Thermoplastic Consolidation
(NTIS Tech Note)
9/TI/4
Laser Velocimetry in Low-Speed Wind Tunnels. Airflow velocity is
measured
with minimal perturbation
(NTIS Tech Note)
9/TI/5
Infrared Wavelength Measuring Device Developed
(NTIS Tech Note)
9/TI/6
New Compact VISAR Interferometer Simplifies Operation
(NTIS Tech Note)
9/TI/7
Corrosion Fatigue of Steel Laser Welds
(NTIS Tech Note)
9/TI/8
Welding and Cutting a Nickel Alloy
by Laser: The technique can be
effective and energy-efficient
(NTIS Tech Note)
9/TI/9
Separating Isotopes With Laser and Electron Beams: The need
for a second
laser is eliminated
(NTIS Tech Note)
?T 9/5/5 À§ÀÇ S9 ¹øÀ» 5¹ø Ãâ·ÂÇü½ÄÀ¸·Î 5¹ø Ãâ·ÂÇÏ´Â ¸í·É
9/5/5
1516584 NTIS Accession Number: NTN91-0142
Infrared Wavelength Measuring Device Developed
(NTIS Tech Note)
National Inst. of Standards and Technology, Gaithersburg, MD.
Corp. Source Codes: 092732000
Sponsor: Department of Commerce, Washington, DC.
Feb 91 1p
Languages: English
Journal Announcement: GRAI9109
FOR ADDITIONAL INFORMATION: Detailed information
about the technology
described may be obtained by ordering the NTIS report, NTIS order
number,
PBPO-221805NAC, price code, A03.
NTIS Prices: Not Available NTIS
Country of Publication: United States
This citation summarizes a one-page announcement of technology
available
for utilization. A precision wavelength device (lambdameter) for
infrared
radiation from diode and gas lasers has been developed at NIST. Intended as
a working standard for wavelength measurement at 1.3 and 1.5 micrometers,
the system also can be used in the red and near-infrared
regions of the
spectrum. The uncertainty of the lambdameter is
about 2 parts in 10
million.
Descriptors: *Laser radiation; *Optical communication;
*Near infrared
radiation
Identifiers: *Wavelength measurement; *Lambdameters; NTISNTND
Section Headings: 46C (Physics--Optics
and Lasers); 45C
(Communication--Common Carrier and Satellite)
E9 53643 DT=TRANSLATION
E10 5344 JA=D
E11 756 JA=D6701
E12 707 JA=D6703
Enter P or E for
more
DT=PATENT´Â ¹Ì±¹Á¤ºÎÀÇ Æ¯Çã ÀÚ·á °Ë»ö½Ã »ç¿ë°¡´É
?SS S6 AND E7
8112
S6 (À§ÀÇ S6 ÀÇ ³»¿ëÀº 8112
LASER/TI,DE*)
S7 38960 DT=PATENT
S8 625 S6
AND DT="PATENT"
?SS S8/1990:1992
625
S8
S9 84014 PY=1990 : PY=1992
S10 21 S8/1990:1992
?T 10/3/1 À§ÀÇ S10À» 3¹ø Ãâ·ÂÇü½ÄÀ¸·Î 1¹ø ·¹Äڵ带 Ãâ·ÂÇÔ
10/3/1
1573070 NTIS Accession Number: N91-32489/7/XAB
Quantum Well, Beam Deflecting Surface Emitting Lasers
(Patent Application)
Kim, J. H.
National Aeronautics and Space Administration,
Pasadena, CA. Pasadena
Office.
Corp. Source Codes: 064668001; ND894694
Report No.: PAT-APPL-7-710 424
Filed 5 Jun 91 22p
Languages: English Document Type: Patent
Journal Announcement: GRAI9204; STAR2924
This Government-owned invention available
for U.S. licensing and,
possibly, for foreign licensing. Copy of application available NTIS.
NTIS Prices: PC N03/MF A01
Country of Publication: United States
Contract No.: NAS7-918
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